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个人信息Personal Information
教授
博士生导师
硕士生导师
教师拼音名称：Feng Jian
电子邮箱：
入职时间：1993-08-01
学历：博士研究生毕业
办公地点：东北大学南湖校区信息学馆304室
性别：男
联系方式：024-83671498(o)
学位：博士
在职信息：在职
主要任职：东北大学信息科学与工程学院电气工程系副主任
其他任职：东北大学智能电气科学与技术研究院副院长
毕业院校：东北大学
- Li Keqin,Feng Jian*Grouping multi-rate sampling fault detection method for penicillin fermentation process.The Canadian Journal of Chemical Engineering,98(6):.[J].1319-1327
- Han Kezhen,Feng Jian*,Li Yueyang,Li Shi.Reduced-order simultaneous state and fault estimator based fault tolerant preview control for discrete-time linear time-invariant systems.IET Control Theory and Applications,12(11):.[J].1601-1610
- Feng Jian*,Han Kezhen,Zhang Huaguang,Yao Yu.Identification-oriented robust finite memory fault detection filter design for networked industrial process with fading channel communication.Neurocomputing,267.[J].624-634
- Han Kezhen,Feng Jian*Robust periodically time varying horizon finite memory fault detection filter design for polytopic uncertain discrete-time systems.International Journal of Robust and Nonlinear Control,27(17):.[J].4116–4137
- Han Kezhen,Feng Jian*,Yao Yu.An integrated data-driven Markov parameters sequence identification and adaptive dynamic programming method to design fault-tolerant optimal tracking control for completely unknown model systems.Journal of the Franklin Institute,354(13):.[J].5280-5301
- Han Kezhen,Feng Jian*,Cui Xiaohong.Fault-tolerant optimized tracking control for unknown discrete-time linear systems using a combined reinforcement learning and residual compensation methodology.International Journal of Systems Science,48(13):.[J].2811-2825
- Feng Jian*,Han Kezhen,Zhao Qing.Memory scheduling robust H infinity filter based fault detection for discrete-time polytopic uncertain systems over fading channels.IET Control Theory and Applications,11(14):.[J].2204-2212
- Feng Jian*,Li Ning.Observer-based event-driven fault-tolerant control for a class of system with state-dependent uncertainties.International Journal of Control,90(5):950-960
- Wang Jian,Feng Jian*,Han Zhiyan.Discriminative feature selection based on imbalance SVDD for fault detection of semiconductor manufacturing processes.Journal of Circuits, Systems and Computers,25(11):
- Han Kezhen,Feng Jian*A combined data-driven robust-estimator and parameter-learning methodology for sensor fault compensation.Proceedings of the 28th Chinese Control and Decision Conference.[C].6810-6815