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Lyu J, Gao B*, Hu L, Lu SD, Tu GF. Microstructure Analysis of HPb59-1 Brass Induced by High Current Pulsed Electron Beam[J]. High Temperature Materials and Processes,2016, 35(7):715-721.

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Pre One:Li X, Gao SB, Xing PF, Dong KZ, Gao B, Feng ZB. Recovery and reutilization of high-quality boron carbide from sapphire wafer griding-waster[J]. Journal of environment management,2018,224:106-112

Next One:Hu L, Gao B*, Zhu G L, Hao Y, Sun S C, Tu G F. The effect of neodymium on the microcracks generated on the Al-17.5Si alloy surface by high current pulsed electron beam[J]. Applied Surface Science, 2016, 364: 490-497.

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