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发表刊物:IEEE Transactions on Instrumentation and Measurement
卷号:72
论文类型:SCI
论文编号:3525713
文献类型:JCR 一区
是否译文:否
上一条:Jinhai Liu*, Mingrui Fu, Feilong Liu, et.al. Window Feature Based 2-stage Defect Identication Using Magnetic Flux Leakage (MFL) Measurements. IEEE Transactions on Instrumentation & Measurement. 2018,67(1):12-23.