东北大学主页平台 Yang Jie--Home-- Characterization of SiC JFETs and its Application in Extreme Temperature(over 450ºC) Circuit Design

+

博士

With Certificate of Graduation for Doctorate Study

Personal Information

Date of Employment:2012-11-01
Business Address:东北大学信息学院415
E-Mail:

VIEW MORE

Home > Scientific Research > Paper Publications

Characterization of SiC JFETs and its Application in Extreme Temperature(over 450ºC) Circuit Design

Release time:2010-09-17 Hits:

Translation or Not:no

Pre One:Effeient Interpolation of High Frequency domain Data by Phase Smoothing

Next One:An All Silicon Carbide High Temperature (450+ °C) High Voltage Gain AC Coupled Differential Amplifier