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1971年6月生，辽宁锦州人博士,教授,博士生导师电气工程系副主任教育部“新世纪优秀人才” IEEE Senior Member 辽宁省“兴辽英才计划“特聘教授辽宁省百千万人才工程百人层次沈阳市高层次领军人才获颁“庆祝中华人民共和国成立70周年”纪念奖章冯健，东北大学教授，东北大学智能电气科学与技术研究院副院长。国家技术发明二等奖获得者，教育部新世纪优秀人才，辽宁省兴辽英才计划科技创...Detials

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Fault detection for the class imbalance problem in semiconductor manufacturing processes

Release Time:2014-04-01 Hits:

First Author: Wang Jian
Correspondence Author: Feng Jian
Co author: Han Zhiyan
Title of Paper: Fault detection for the class imbalance problem in semiconductor manufacturing processes
Journal: Journal of Circuits, Systems and Computers
Issue: 4
Volume: 23
Indexed by: SCI检索
Translation or Not: No

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