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Title of Paper:Yong Hu,* Guo-Zhen Wu, Yan Liu, An Du. Relative-thickness dependence of exchange bias in bilayers and trilayers, Journal of Magnetism and Magnetic Materials 324, 3204-3208 (2012)
Translation or Not:No
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Paper Publications
Yong Hu,* Guo-Zhen Wu, Yan Liu, An Du. Relative-thickness dependence of exchange bias in bilayers and trilayers, Journal of Magnetism and Magnetic Materials 324, 3204-3208 (2012)
Attachments
Prev One:Yong Hu,* Guozhen Wu, Yan Liu, Xiaolong Yang, An Du. Defect dependent multiple magnetization plateaus in frustrated spin-chain cobaltate, Journal of Magnetism and Magnetic Materials 337-338, 46-52 (2013)
Next One:Yong Hu,* Guozhen Wu, Yan Liu, An Du. Resultant exchange bias and coercivity on rotatable antiferromagnetic anisotropy in ellipsoidal core/shell nanoparticles, Physics Letters A 376, 1650-1656 (2012)