东北大学主页平台于瑞云--中文主页-- R. Yu, Z. Zhao and S. Zhen. Auxiliary Information Flow for 3D Industrial Defect Detection on IC Ceramic Package Substrate Surfaces: Dataset and Benchmark. IEEE Transactions on Circuits and Systems for Video Technology, 2026. (中科院1区TOP)

于瑞云

教授博士生导师硕士生导师
教师拼音名称：Yu Ruiyun
电子邮箱：

访问量：

开通时间：..

最后更新时间：..

扫描访问手机版

论文成果

当前位置: 中文主页 >> 科学研究 >> 论文成果

R. Yu, Z. Zhao and S. Zhen. Auxiliary Information Flow for 3D Industrial Defect Detection on IC Ceramic Package Substrate Surfaces: Dataset and Benchmark. IEEE Transactions on Circuits and Systems for Video Technology, 2026. (中科院1区TOP)

发布时间：2026-03-06　点击次数：

是否译文：否

上一条：B. Guo , Q. Zuo, R. Yu. Point Cloud Segmentation of Integrated Circuits Package Substrates Surface Defects Using Causal Inference: Dataset Construction and Methodology. AAAI Conference on Artificial Intelligence. 2026. (CCF A)

下一条：S. Cao, J. Li, R. Yu, et al. DWT-3DRec: DeepJSCC-based wireless transmission for efficient 3D scene reconstruction using CityNeRF. Digital Communications and Networks, 2025.