Title:一种可测量多通道分析物的C型光子晶体平面阵列
Patent Applicant:吴奇鲁(S)
Note:专利证书编号:ZL201910406226.4
Service Invention or Not:No
Application Date:2020-05-16
Publication Date:2020-06-05
Authorization Date:2020-06-05
First Author:Zhao Yong
Patents
一种可测量多通道分析物的C型光子晶体平面阵列
Release Time:2021-03-04| Hits: