Ruiyun Yu
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Yu Ruiyun, Director of the Office of Information Construction and Network Security at Northeastern University, and a third-level professor at the School of Software. Visiting scholar at the University of California, Irvine and the University of Texas at Arlington. Chief Scientist of the major project of the Industrial Internet Innovation and Development Project of the Ministry of Industry and Information Technology (MIIT), Director of the Industrial Internet Platform Application Innovation Promotion Center of MIIT, Director of the Shenyang Core Node of the backbone network of China Education and Research Network (CERNET). Associate Editor of IEEE Transactions on Industrial Informatics (IEEE TII). Leading talent of Liaoning Province's "Xingliao Talent Plan", outstanding scientific and technological worker of Liaoning Province, and leading talent of Shenyang City. Outstanding member of the Chinese Computer Society (CCF), Executive Member of the IoT Special Committee of CCF, Member of the Visual Inspection Special Committee of the China Society of Image and Graphics, and Member of the Standards Working Committee of the Chinese Association of Automation.
From 2009 to 2023, he served as Assistant Dean and Vice Dean of the School of Software at Northeastern University, responsible for undergraduate teaching, school-enterprise cooperation, international education, and discipline construction. Currently, he teaches courses including Artificial Intelligence (undergraduate), Advanced Artificial Intelligence (master's), and Computational Intelligence and Information Systems (doctoral).
The main research directions are industrial vision, temporal perception data analysis, and 3D spatial intelligence. He actively promotes technological innovation in the field of "intelligent manufacturing for integrated circuits," conducting research on intelligent software, algorithms, and application systems targeting integrated circuit wafer front-end processes, packaging substrate manufacturing, and advanced packaging processes. As the project leader, he has led more than 30 research projects including National Key R&D Program projects, MIIT high-quality development special projects, and National Natural Science Foundation of China projects, with a total project budget exceeding 130 million yuan. A series of innovative achievements have been made in micro/nano-scale surface defect detection methods for integrated circuits, intelligent anomaly detection and prediction methods for precision manufacturing quality, and manufacturing process stability control methods, with multiple outcomes already deployed in industry. Breakthrough progress has been achieved in large model-based micro/nano-scale defect detection methods and the development of AOI equipment for chip packaging substrates; the visual inspection technology for chip ceramic packaging substrates was selected and published at the National Science and Technology Communication Center. More than 110 academic papers have been published in top journals such as TKDE, TCSVT, TII, and TMech, and top conferences such as ICCV, AAAI, and INFOCOM. He has been granted more than 30 invention patents, with 3 patent technology transfers at a total value of 11.55 million yuan, led the preparation of 2 group standards, and participated in 5 international standards and 1 national standard. He has received the First Prize of the Invention and Entrepreneurship Award from the China Invention Association, 1 Gold Award at the International Invention Exhibition, 1 Second Prize for Scientific and Technological Progress from the Chinese Society of Instrumentation, 1 Second Prize for National Teaching Achievement, and 3 First Prizes for Teaching Achievement in Liaoning Province.
English homepage: https://yuryneu.github.io/
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