东北大学主页平台 Ruiyun Yu--Home-- R. Yu, H. Li, B. Guo and Z. Zhao, "Background-Weaken Generalization Network for Few-Shot Industrial Metal Defect Segmentation," in IEEE Transactions on Instrumentation and Measurement, vol. 74, pp. 1-11, 2025. (IF:5.9, SCI JCR Q1)

Ruiyun Yu

Professor Supervisor of Doctorate Candidates Supervisor of Master's Candidates
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R. Yu, H. Li, B. Guo and Z. Zhao, "Background-Weaken Generalization Network for Few-Shot Industrial Metal Defect Segmentation," in IEEE Transactions on Instrumentation and Measurement, vol. 74, pp. 1-11, 2025. (IF:5.9, SCI JCR Q1)

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Pre One:H. Li, R. Yu and B. Guo, "Fine-Grained Region Perception Network for Few-Shot Defect Classification of IC Package Substrates: Benchmark Methodology and Dataset", in The 51th Annual Conference of the IEEE Industrial Electrics Society.

Next One:R Yu, B Guo, K Yang. Selective Prototype Network for Few-Shot Metal Surface Defect Segmentation. IEEE Transactions on Instrumentation and Measurement, 2022 (71), 1-10. (IF: 5.332, SCI JCR Q1)