东北大学主页平台 Ruiyun Yu--Home-- S. Zhen, R. Yu and H. Li, "MEDNet: Memory-Enhanced Discriminative Feature Learning for Few-Shot Metal Defect Classification", in The 51th Annual Conference of the IEEE Industrial Electrics Society.

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S. Zhen, R. Yu and H. Li, "MEDNet: Memory-Enhanced Discriminative Feature Learning for Few-Shot Metal Defect Classification", in The 51th Annual Conference of the IEEE Industrial Electrics Society.

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Pre One:R. Yu, B. Guo, and H. Li. "Anomaly Detection of Integrated Circuits Package Substrates Using the Large Vision Model SAIC: Dataset Construction, Methodology, and Application," in IEEE/CVF International Conference on Computer Vision, 2025. (CCF A)