一种可测量多通道分析物的C型光子晶体平面阵列

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Patent Applicant:吴奇鲁(S)

Note:专利证书编号:ZL201910406226.4

Service Invention or Not:no

Application Date:2020-05-16

Publication Date:2020-06-05

Authorization Date:2020-06-05

First Author:Zhao Yong