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Ruiyun Yu

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M. Chen, R. Yu, Z. Liang, K. Li, H. Qi, "A Multiscale Process-aware Retention Network for Fault Prediction in Mixed-model Production," Computers in Industry, vol. 170, 104313, 2025. (IF:9.1, 中科院1区)

Release Time:2025-07-07| Hits:

Title of Paper:M. Chen, R. Yu, Z. Liang, K. Li, H. Qi, "A Multiscale Process-aware Retention Network for Fault Prediction in Mixed-model Production," Computers in Industry, vol. 170, 104313, 2025. (IF:9.1, 中科院1区)

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Prev One:R. Yu, H. Li, B. Guo and Z. Zhao, "Background-Weaken Generalization Network for Few-Shot Industrial Metal Defect Segmentation," in IEEE Transactions on Instrumentation and Measurement, vol. 74, pp. 1-11, 2025. (IF:5.9, SCI JCR Q1)

Next One:R. Yu, M. Chen, and B. Liu, “A triple-phase boost transformer for industrial equipment fault prediction,” Neurocomputing, vol. 619, pp. 129137, 2025. (IF:6.5, SCI JCR Q1)