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Ruiyun Yu

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H. Li, R. Yu and B. Guo, "Fine-Grained Region Perception Network for Few-Shot Defect Classification of IC Package Substrates: Benchmark Methodology and Dataset", in The 51th Annual Conference of the IEEE Industrial Electrics Society.

Release Time:2025-07-07| Hits:

Title of Paper:H. Li, R. Yu and B. Guo, "Fine-Grained Region Perception Network for Few-Shot Defect Classification of IC Package Substrates: Benchmark Methodology and Dataset", in The 51th Annual Conference of the IEEE Industrial Electrics Society.

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Prev One:A. Ibrahim, Q. Zhao, H. Li, and R. Yu, "Feature Adaptive Selection and Fusion Network for Small Object Detection in Traffic Perception", in The 51th Annual Conference of the IEEE Industrial Electrics Society.

Next One:R. Yu, H. Li, B. Guo and Z. Zhao, "Background-Weaken Generalization Network for Few-Shot Industrial Metal Defect Segmentation," in IEEE Transactions on Instrumentation and Measurement, vol. 74, pp. 1-11, 2025. (IF:5.9, SCI JCR Q1)