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S. Zhen, R. Yu and H. Li, "MEDNet: Memory-Enhanced Discriminative Feature Learning for Few-Shot Metal Defect Classification", in The 51th Annual Conference of the IEEE Industrial Electrics Society.

Release Time:2025-07-07| Hits:

Title of Paper:S. Zhen, R. Yu and H. Li, "MEDNet: Memory-Enhanced Discriminative Feature Learning for Few-Shot Metal Defect Classification", in The 51th Annual Conference of the IEEE Industrial Electrics Society.

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