东北大学主页平台 Ruiyun Yu--Home-- H. Li, R. Yu and B. Guo, "Fine-Grained Region Perception Network for Few-Shot Defect Classification of IC Package Substrates: Benchmark Methodology and Dataset", in The 51th Annual Conference of the IEEE Industrial Electrics Society.

Ruiyun Yu

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S. Zhen, R. Yu and H. Li, "MEDNet: Memory-Enhanced Discriminative Feature Learning for Few-Shot Metal Defect Classification", in The 51th Annual Conference of the IEEE Industrial Electrics Society.

Release Time:2025-07-07| Hits:

Title of Paper:S. Zhen, R. Yu and H. Li, "MEDNet: Memory-Enhanced Discriminative Feature Learning for Few-Shot Metal Defect Classification", in The 51th Annual Conference of the IEEE Industrial Electrics Society.

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Prev One:R. Yu, B. Guo, and H. Li. "Anomaly Detection of Integrated Circuits Package Substrates Using the Large Vision Model SAIC: Dataset Construction, Methodology, and Application," in IEEE/CVF International Conference on Computer Vision, 2025. (CCF A)

Next One:A. Ibrahim, Q. Zhao, H. Li, and R. Yu, "Feature Adaptive Selection and Fusion Network for Small Object Detection in Traffic Perception", in The 51th Annual Conference of the IEEE Industrial Electrics Society.