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R. Yu, B. Guo, and H. Li. "Anomaly Detection of Integrated Circuits Package Substrates Using the Large Vision Model SAIC: Dataset Construction, Methodology, and Application," in IEEE/CVF International Conference on Computer Vision, 2025. (CCF A)

Release Time:2025-07-07| Hits:

Title of Paper:R. Yu, B. Guo, and H. Li. "Anomaly Detection of Integrated Circuits Package Substrates Using the Large Vision Model SAIC: Dataset Construction, Methodology, and Application," in IEEE/CVF International Conference on Computer Vision, 2025. (CCF A)

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