东北大学主页平台于瑞云--中文主页-- R. Yu, H. Li, B. Guo and Z. Zhao, "Background-Weaken Generalization Network for Few-Shot Industrial Metal Defect Segmentation," in IEEE Transactions on Instrumentation and Measurement, vol. 74, pp. 1-11, 2025. (IF:5.9, SCI JCR Q1)

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教授博士生导师硕士生导师
教师拼音名称：Yu Ruiyun
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毕业院校：东北大学

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R. Yu, H. Li, B. Guo and Z. Zhao, "Background-Weaken Generalization Network for Few-Shot Industrial Metal Defect Segmentation," in IEEE Transactions on Instrumentation and Measurement, vol. 74, pp. 1-11, 2025. (IF:5.9, SCI JCR Q1)

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上一条：H. Li, R. Yu and B. Guo, "Fine-Grained Region Perception Network for Few-Shot Defect Classification of IC Package Substrates: Benchmark Methodology and Dataset", in The 51th Annual Conference of the IEEE Industrial Electrics Society.

下一条：R. Yu, M. Chen, and B. Liu, “A triple-phase boost transformer for industrial equipment fault prediction,” Neurocomputing, vol. 619, pp. 129137, 2025. (IF:6.5, SCI JCR Q1)