东北大学主页平台于瑞云--中文主页-- H. Li, R. Yu and B. Guo, "Fine-Grained Region Perception Network for Few-Shot Defect Classification of IC Package Substrates: Benchmark Methodology and Dataset", in The 51th Annual Conference of the IEEE Industrial Electrics Society.

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教授博士生导师硕士生导师
教师拼音名称：Yu Ruiyun
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毕业院校：东北大学

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H. Li, R. Yu and B. Guo, "Fine-Grained Region Perception Network for Few-Shot Defect Classification of IC Package Substrates: Benchmark Methodology and Dataset", in The 51th Annual Conference of the IEEE Industrial Electrics Society.

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上一条：A. Ibrahim, Q. Zhao, H. Li, and R. Yu, "Feature Adaptive Selection and Fusion Network for Small Object Detection in Traffic Perception", in The 51th Annual Conference of the IEEE Industrial Electrics Society.

下一条：R. Yu, H. Li, B. Guo and Z. Zhao, "Background-Weaken Generalization Network for Few-Shot Industrial Metal Defect Segmentation," in IEEE Transactions on Instrumentation and Measurement, vol. 74, pp. 1-11, 2025. (IF:5.9, SCI JCR Q1)