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上一条:S. Zhen, R. Yu and H. Li, "MEDNet: Memory-Enhanced Discriminative Feature Learning for Few-Shot Metal Defect Classification", in The 51th Annual Conference of the IEEE Industrial Electrics Society.
下一条:H. Li, R. Yu and B. Guo, "Fine-Grained Region Perception Network for Few-Shot Defect Classification of IC Package Substrates: Benchmark Methodology and Dataset", in The 51th Annual Conference of the IEEE Industrial Electrics Society.